Scanning Probe Microscopy (SPM):
Consists of a family of microscopy forms where a sharp probe is scanned across a surface and probe/sample interaction is monitored.
The SPM can operate in contact mode, non-contact mode and tapping mode. Each of these modes have their own set of advantages and disadvantages. The SPM can give one information about the topography of a sample surface, and in addition one can also obtain information regarding phase differences, electrical properties, and quantitative nano-mechanical properties such as adhesion and Young’s Modulus.
The electrical properties can be measured using Scanning Capacitance Microscopy (SCM), Tunneling Atomic Force Microscopy (TUNA) and Conductive AFM (C-AFM).
Contact: Jackie Nel