Posted on October 12, 2010
After a two-week final stretch the winners of the first Carl Zeiss Nano Image Contest have now been chosen.
The winners are Heinrich Badenhorst from the University of Pretoria, South Africa (category Scanning Electron Microscopy (SEM), Norman Hauke and Arne Laucht of the Walter Schottky Institute of Munich Technical University, Germany (category CrossBeam (FIB-SEM), Dr. Emile van Veldhoven of the TNO Research Institute in Delft, Netherlands, (category Helium Ion Microscopy (HIM) and Dr. Andrey Burov of the Russian Academy of Sciences in Saratov in the category Transmission Electron Microscopy (TEM). The Managing Director of Carl Zeiss NTS, Dr. Frank Stietz, is very pleased at the excellent response to the contest with over 120 entries: “The broad spectrum of application topics, the technical quality and the artistic composition of the nano images are fascinating. We would like to thank all participants for their entries and extend our congratulations to the winners.”
First prize in the SEM category was awarded to Heinrich Badenhorst with his image of a bizarre landscape made of graphite, captured with an ULTRA REM. With a total of 7000 points, his image received the most votes of all categories. “Our ZEISS ULTRA has allowed me to make massive progress in my research in the past year. ZEISS SEM technology helped me to uncover aspects of graphite oxidation which I have never seen before,” stresses Badenhorst, a scientist working in the field of graphite technology.
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